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Proceedings Paper

Analysis of noise sources in frequency-domain fluorometry
Author(s): Martin J. vandeVen; Beniamino B. Barbieri; Enrico Gratton; John S. Maier
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Paper Abstract

In frequency domain fluorometry, as well as all other spectroscopic techniques, the noise ultimately limits the sensitivity of the instrument and the precision of the measurement. The analysis of the sources of noise in different instruments has revealed that the noise is due to a number of different instrumental factors rather than photon statistics. The ultimate goal is to eliminate those factors to achieve a situation in which the limit is the detector intrinsic noise. We have developed a system, based on digital signal processing, in which the influence of several spurious noise sources has been reduced. A study of the range of cross-correlation frequencies used to obtain the best signal-to-noise ratio is presented.

Paper Details

Date Published: 1 April 1992
PDF: 10 pages
Proc. SPIE 1640, Time-Resolved Laser Spectroscopy in Biochemistry III, (1 April 1992); doi: 10.1117/12.58225
Show Author Affiliations
Martin J. vandeVen, ISS, Inc. (United States)
Beniamino B. Barbieri, ISS, Inc. (United States)
Enrico Gratton, Univ. of Illinois/Urbana-Champaign (United States)
John S. Maier, Univ. of Illinois/Urbana-Champaign (United States)

Published in SPIE Proceedings Vol. 1640:
Time-Resolved Laser Spectroscopy in Biochemistry III
Joseph R. Lakowicz, Editor(s)

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