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Proceedings Paper

New imaging mode in atomic-force microscopy based on the error signal
Author(s): Constant A.J. Putman; Kees O. van der Werf; Bart G. de Grooth; Niko F. van Hulst; Jan Greve; Paul K. Hansma
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Paper Abstract

A new imaging mode, the error signal mode, is introduced to atomic force microscopy. In this mode, the error signal is displayed while imaging in the height mode. The feedback loop serves as a high-pass filter that filters out the low spatial frequency components of the surface, leaving only the high spatial frequency components of the surface to contribute to the error signal and to be displayed. At a scan rate of typically 10 lines per second, images taken in this mode show very fine detail. Since the applied force stays nearly constant, the error signal mode is especially suitable for imaging soft biological samples with a high level of detail without damaging the surface.

Paper Details

Date Published: 1 May 1992
PDF: 7 pages
Proc. SPIE 1639, Scanning Probe Microscopies, (1 May 1992); doi: 10.1117/12.58191
Show Author Affiliations
Constant A.J. Putman, Univ. of Twente (Netherlands)
Kees O. van der Werf, Univ. of Twente (Netherlands)
Bart G. de Grooth, Univ. of Twente (Netherlands)
Niko F. van Hulst, Univ. of Twente (Netherlands)
Jan Greve, Univ. of Twente (Netherlands)
Paul K. Hansma, Univ. of California/Santa Barbara (United States)

Published in SPIE Proceedings Vol. 1639:
Scanning Probe Microscopies
Srinivas Manne, Editor(s)

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