Share Email Print

Proceedings Paper

Operation of a scanning near-field optical microscope in reflection in combination with a scanning force microscope
Author(s): Niko F. van Hulst; Marco H. P. Moers; Oscar Noordman; T. Faulkner; F. B. Segerink; Kees O. van der Werf; Bart G. de Grooth; Bouwe Bolger
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Images obtained with a scanning near field optical microscope (SNOM) operating in reflection are presented. We have obtained the first results with a SiN tip as optical probe. The instrument is simultaneously operated as a scanning force microscope (SFM). Moreover, the instrument incorporates an inverted light microscope (LM) for preselection of a scan area. The SiN probe is operated in the contact regime causing a highly improved lateral resolution in the optical image compared to an alternative set-up using a fiber probe, which is also presented. The combined microscope is operated either in open loop or as a force regulated SNOM. Near field optical images can be directly compared with the topography displayed in the simultaneously recorded SFM image.

Paper Details

Date Published: 1 May 1992
PDF: 8 pages
Proc. SPIE 1639, Scanning Probe Microscopies, (1 May 1992); doi: 10.1117/12.58190
Show Author Affiliations
Niko F. van Hulst, Univ. of Twente (Netherlands)
Marco H. P. Moers, Univ. of Twente (Netherlands)
Oscar Noordman, Univ. of Twente (Netherlands)
T. Faulkner, Univ. of Twente (Netherlands)
F. B. Segerink, Univ. of Twente (Netherlands)
Kees O. van der Werf, Univ. of Twente (Netherlands)
Bart G. de Grooth, Univ. of Twente (Netherlands)
Bouwe Bolger, Univ. of Twente (Netherlands)

Published in SPIE Proceedings Vol. 1639:
Scanning Probe Microscopies
Srinivas Manne, Editor(s)

© SPIE. Terms of Use
Back to Top