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Proceedings Paper

A novel approach for precise measurement of angular displacement based on attenuated total reflectance
Author(s): Fan Chen; Zhuangqi Cao; Qishun Shen; Jianghua Gu
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Paper Abstract

A simple method for the measurement of angular displacement is proposed. As a laser beam is incident on a planar optical waveguide, the m-lines will be obtained by scanning the angle of incidence. It is found that the m-lines will shift with the variation of the thickness of the guided layer. And interesting measurement approaches which are based on intensity measurement and angle interrogation, respectively, are described. Theoretical results and simulation show that intensity measurement is more sensitive than angle interrogation. And small angle of incidence is more sensitive than large angle of incidence which corresponds to high-order modes and low-order modes, respectively.

Paper Details

Date Published: 25 October 2004
PDF: 12 pages
Proc. SPIE 5602, Optomechatronic Sensors, Actuators, and Control, (25 October 2004); doi: 10.1117/12.581890
Show Author Affiliations
Fan Chen, Shanghai Jiao Tong Univ. (China)
Zhuangqi Cao, Shanghai Jiao Tong Univ. (China)
Qishun Shen, Shanghai Jiao Tong Univ. (China)
Jianghua Gu, Shanghai Jiao Tong Univ. (China)


Published in SPIE Proceedings Vol. 5602:
Optomechatronic Sensors, Actuators, and Control
Kee S. Moon, Editor(s)

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