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Proceedings Paper

Dynamic studies of crystal growth using the AFM
Author(s): Andrew J. Gratz; Paul E. Hillner; Srinivas Manne; Paul K. Hansma
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Paper Abstract

Recent advances in AFM technology allow direct observation of solution growth and dissolution (etching) processes important in industry and nature, and direct tests of crystal growth models. We present results of studies of calcite and quartz, including real-time, in situ observations. While both crystals experience layer growth/dissolution, calcite grows by direct addition of material to growth steps without an important contribution from surface diffusion; quartz surfaces are consistent with more traditional, BCF-type growth models. Dynamic AFM observations of growth processes may allow optimization of industrial systems.

Paper Details

Date Published: 1 May 1992
PDF: 4 pages
Proc. SPIE 1639, Scanning Probe Microscopies, (1 May 1992); doi: 10.1117/12.58185
Show Author Affiliations
Andrew J. Gratz, Lawrence Livermore National Lab. (United States)
Paul E. Hillner, Univ. of California/Santa Barbara (United States)
Srinivas Manne, Univ. of California/Santa Barbara (United States)
Paul K. Hansma, Univ. of California/Santa Barbara (United States)

Published in SPIE Proceedings Vol. 1639:
Scanning Probe Microscopies
Srinivas Manne, Editor(s)

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