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Proceedings Paper

Atomic-scale imaging of albite feldspar, calcium carbonate, rectorite, and bentonite using atomic-force microscopy
Author(s): Barney Drake; Roland Hellmann; C. Steven Sikes; Mario L. Occelli
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Paper Abstract

Atomic force microscopy (AFM) was used to investigate the (010) surface of Amelia albite, the basal and (001) planes of CaCO3 (calcite), and the basal planes of rectorite and bentonite. Atomic scale images of the albite surface show six sided, interconnected en-echelon rings. Fourier transforms of the surface scans reveal two primary nearest neighbor distances of 4.7 and 4.9 +/- 0.5 angstroms. Analysis of the images using a 6 angstroms thick projection of the bulk structure was performed. Close agreement between the projection and the images suggests the surface is very close to an ideal termination of the bulk structure. Images of the calcite basal plane show a hexagonal array of Ca atoms measured to within +/- 0.3 angstroms of the 4.99 angstroms predicted by x-ray diffraction data. Putative images of the (001) plane of carbonate ions, with hexagonal 5 angstroms spacing, are also presented and discussed. Basal plane images of rectorite show hexagonal symmetry with 9.1 +/- 2.5 angstroms spacing, while bentonite results reveal a 4.9 +/- 0.5 angstroms nearest neighbor spacing.

Paper Details

Date Published: 1 May 1992
PDF: 9 pages
Proc. SPIE 1639, Scanning Probe Microscopies, (1 May 1992); doi: 10.1117/12.58182
Show Author Affiliations
Barney Drake, Imaging Services (United States)
Roland Hellmann, Univ. Joseph Fourier (France)
C. Steven Sikes, Univ. of South Alabama (United States)
Mario L. Occelli, Georgia Institute of Technology (United States)

Published in SPIE Proceedings Vol. 1639:
Scanning Probe Microscopies
Srinivas Manne, Editor(s)

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