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Proceedings Paper

Magnetic-force microscope study of the micromagnetics of submicron magnetic particles
Author(s): Gary A. Gibson; Sheldon Schultz; Wenjie Chen; D. R. Fredkin
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Paper Abstract

A high resolution, high sensitivity magnetic force microscope (MFM) with the ability to image in an in situ magnetic field will be described. This MFM has been used to investigate the micromagnetics of nanolithographically produced magnetic particles. It will be shown that the particles' switching field can be determined without being perturbed by the stray fields from the sensing tip. This allows the study of the evolution of the particles' magnetic states as a function of applied field and the direct observation of cooperative switching. The MFM has also been used, in conjunction with an external biasing field, as a localized source of flux for testing the stability of magnetic states and setting model magnetic configurations. MFM images of the particles are compared with numerical simulations. These comparisons have also provided insight into the magnetic behavior of the MFM sensing tips.

Paper Details

Date Published: 1 May 1992
PDF: 5 pages
Proc. SPIE 1639, Scanning Probe Microscopies, (1 May 1992); doi: 10.1117/12.58181
Show Author Affiliations
Gary A. Gibson, Univ. of California/San Diego (United States)
Sheldon Schultz, Univ. of California/San Diego (United States)
Wenjie Chen, Univ. of California/San Diego (United States)
D. R. Fredkin, Univ. of California/San Diego (United States)

Published in SPIE Proceedings Vol. 1639:
Scanning Probe Microscopies
Srinivas Manne, Editor(s)

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