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Proceedings Paper

Dielectric layers SiO2: TiO2 produced using the sol-gel technology for the application in planar sensors
Author(s): Pawel Karasinski
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Paper Abstract

The paper presents the results of investigations involving the influence of drying time and annealing temperature on refractive index and thickness of two-component dielectric layers SiO2:TiO2 produced with the application of sol-gel technology. The production technology and the method for the determination of parameters of the produced layers has been discussed. The results of theoretical analysis of planar refractometer has been presented in the system of difference interferometer produced with the application of the elaborated planar waveguides.

Paper Details

Date Published: 8 September 2004
PDF: 5 pages
Proc. SPIE 5576, Lightguides and their Applications II, (8 September 2004); doi: 10.1117/12.581741
Show Author Affiliations
Pawel Karasinski, Silesian Univ. of Technology (Poland)

Published in SPIE Proceedings Vol. 5576:
Lightguides and their Applications II
Jan Wojcik; Waldemar Wojcik, Editor(s)

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