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Proceedings Paper

Application of modified method of m-line spectroscopy to optical research of anisotropic materials
Author(s): Elzbieta Augusciuk
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Paper Abstract

Determination of planar waveguide parameters with a deposited thin layer such as a refractive index and thickness by the method of m-line spectroscopy is possible. Application of the method to determination of thin film parameters of anisotropy material has been presented in this paper. Depositing of a very small quantity of the material on the planar waveguide changes propagation depending on a texture of a crystal. Liquid crystal (LC) is typical material characterizing the texture. Optical parameters of anisotropic materials (LC) have been determined by the modified m-line spectroscopy in four-layer waveguide structures. Preliminary investigation of application of this method to the study of anisotropic materials has been confirmed.

Paper Details

Date Published: 8 September 2004
PDF: 3 pages
Proc. SPIE 5576, Lightguides and their Applications II, (8 September 2004); doi: 10.1117/12.581734
Show Author Affiliations
Elzbieta Augusciuk, Warsaw Univ. of Technology (Poland)


Published in SPIE Proceedings Vol. 5576:
Lightguides and their Applications II
Jan Wojcik; Waldemar Wojcik, Editor(s)

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