Share Email Print

Proceedings Paper

Resolution issues in scanning optical microscopies
Author(s): Eric L. Buckland; Patrick J. Moyer; Michael A. Paesler
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

Several issues concerning lateral spatial resolution in scanning optical microscopes, SOM's, are addressed. After identifying what is meant by resolution in an SOM, the role of probe tip morphology is discussed. Consideration of the physical mechanism of signal transduction is made, and fundamental differences between near field SOM's and evanescent field SOM's are underscored. Therole of dithering of the probe tip in improving resolution is demonstrated and discussed.

Paper Details

Date Published: 1 May 1992
PDF: 7 pages
Proc. SPIE 1639, Scanning Probe Microscopies, (1 May 1992); doi: 10.1117/12.58171
Show Author Affiliations
Eric L. Buckland, North Carolina State Univ. and Sumitomo Electric Fiber Optic (United States)
Patrick J. Moyer, North Carolina State Univ. (United States)
Michael A. Paesler, North Carolina State Univ. (United States)

Published in SPIE Proceedings Vol. 1639:
Scanning Probe Microscopies
Srinivas Manne, Editor(s)

© SPIE. Terms of Use
Back to Top