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Proceedings Paper

Resolution issues in scanning optical microscopies
Author(s): Eric L. Buckland; Patrick J. Moyer; Michael A. Paesler
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Paper Details

Date Published: 1 May 1992
PDF: 7 pages
Proc. SPIE 1639, Scanning Probe Microscopies, (1 May 1992); doi: 10.1117/12.58171
Show Author Affiliations
Eric L. Buckland, North Carolina State Univ. and Sumitomo Electric Fiber Optic (United States)
Patrick J. Moyer, North Carolina State Univ. (United States)
Michael A. Paesler, North Carolina State Univ. (United States)


Published in SPIE Proceedings Vol. 1639:
Scanning Probe Microscopies
Srinivas Manne, Editor(s)

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