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Proceedings Paper

An integrated evolutionary programming and impedance-based NDE method
Author(s): Yaowen Yang; Chee Kiong Soh; Jianfeng Xu
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Paper Abstract

Nondestructive evaluation (NDE) is essential in civil and building engineering. Impedance-based method uses the electro-mechanical coupling effect of piezoceramic lead-zirconate-titanate (PZT) materials to measure the force impedance of the structure. By comparing the impedance spectra of the damaged structure with the baseline (the impedance spectra for the pristine structure), the damage in the structure can be assessed. The impedance-based method has shown some advantages over the traditional NDE methods. However, it is not able to identify the location and quantity of the damage simultaneously. This paper presents a technique to overcome this limitation. The technique first measures the variations of the electro-mechanical impedance of the structure, which is similar to the impedance-based method, so that it can inherit the advantage of convenience in operation from the impedance-based method. The damage is then identified by a system identification technique which is generally employed in the vibration-based method. Due to the numerous local optima in the search space, the traditional optimization strategies may not be able to find the correct solution. This paper selects evolutionary programming (EP) as the system identification technique for its robustness in finding the global optimum. Thus, the location and the quantity of the damage can be simultaneously identified. In order to enhance the feasibility of the integrated EP and impedance-based (inEPIB) technique, a fitness function, which can be generally applied to other methods, is proposed to discriminate the variations caused by damages from the discrepancies caused by modeling errors. Experiments are carried out on beams and plates to verify the damage detection results. The results demonstrate that both the location and extent of damage can be simultaneously identified.

Paper Details

Date Published: 28 February 2005
PDF: 8 pages
Proc. SPIE 5649, Smart Structures, Devices, and Systems II, (28 February 2005); doi: 10.1117/12.581489
Show Author Affiliations
Yaowen Yang, Nanyang Technological Univ. (Singapore)
Chee Kiong Soh, Nanyang Technological Univ. (Singapore)
Jianfeng Xu, Nanyang Technological Univ. (Singapore)


Published in SPIE Proceedings Vol. 5649:
Smart Structures, Devices, and Systems II
Said F. Al-Sarawi, Editor(s)

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