Share Email Print
cover

Proceedings Paper

A measuring technology for fiber connector end surface
Author(s): Yanjun Fu; Wendong Zou; Huirong Xiao; Yuehong Gan
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

A non-contact optical microscopy system is described. It adopts basic Michelson structure to measure the characteristic of end surface of the fiber connector. We take use of the Fourier transform to process interference pattern. Getting the high information of two-dimension section picture. We take use of the First Derivative is extremum and Second Derivative is zero to detect the edge jump points. And we take use of Least Square Method etc. curve fitting method to describe the two-dimension section picture. We analyze the method to measure geometrical parameters of end surface. Then we can measure the characteristic of end surface. For example: the geometric parameters and roughness.

Paper Details

Date Published: 20 January 2005
PDF: 9 pages
Proc. SPIE 5633, Advanced Materials and Devices for Sensing and Imaging II, (20 January 2005); doi: 10.1117/12.581452
Show Author Affiliations
Yanjun Fu, Nanchang Institute of Aeronautical Technology (China)
Wendong Zou, Nanchang Institute of Aeronautical Technology (China)
Huirong Xiao, Nanchang Institute of Aeronautical Technology (China)
Yuehong Gan, Nanchang Institute of Aeronautical Technology (China)


Published in SPIE Proceedings Vol. 5633:
Advanced Materials and Devices for Sensing and Imaging II
Anbo Wang; Yimo Zhang; Yukihiro Ishii, Editor(s)

© SPIE. Terms of Use
Back to Top