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Proceedings Paper

Practical applications in film and optics measurements for dual-lightsource interferometry
Author(s): Todd Blalock; Steve Heveron-Smith
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Paper Abstract

Current inspection and QA technology is dominated in the packaging industry by on-line beta gauges, capacitance testing and infrared technology as well as off-line microscopy and basis weight processes. The optics industry uses standard interferometers, gauge block comparators and other contact technology. Current Dual light source interferometer technology, employed by Lumetrics, allows rapid off-line and on-line non-contact inspection of multi-layer plastics and coating applications, as well as optics and optical assemblies. Practical applications in numerous industries will be discussed. Results of online testing of a multi-layer label stock will also be presented.

Paper Details

Date Published: 14 December 2004
PDF: 7 pages
Proc. SPIE 5589, Fiber Optic Sensor Technology and Applications III, (14 December 2004); doi: 10.1117/12.581072
Show Author Affiliations
Todd Blalock, Lumetrics, Inc. (United States)
Steve Heveron-Smith, Lumetrics, Inc. (United States)


Published in SPIE Proceedings Vol. 5589:
Fiber Optic Sensor Technology and Applications III
Michael A. Marcus; Brian Culshaw; John P. Dakin, Editor(s)

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