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Proceedings Paper

Study of tips in an ultrafast scanning tunneling microscope
Author(s): Tian Lan; Guoqiang Ni
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Paper Abstract

Ultrafast measurement system for transient electrical signals using a scanning tunneling microscope has been developed. The key of the system is a probe integrated with a low-temperature grown GaAs photoconductive switch that is used as a sampler of transient signals generated by ultrashort laser pulses with another photoconductive switch. The tunneling tip is attached to a coplanar strip transmission line with an integrated photoconductive switch. The probe fabrication process and tip characteristics have been reported here. A topographic STM image scanned with such a probe on a gold sample on Si substrate is given. A transient signal with 1.2 ps pulse width in tunneling mode and 2.0 ps in contact mode were observed with the probe.

Paper Details

Date Published: 20 January 2005
PDF: 5 pages
Proc. SPIE 5633, Advanced Materials and Devices for Sensing and Imaging II, (20 January 2005); doi: 10.1117/12.581062
Show Author Affiliations
Tian Lan, Beijing Institute of Technology (China)
Guoqiang Ni, Beijing Institute of Technology (China)

Published in SPIE Proceedings Vol. 5633:
Advanced Materials and Devices for Sensing and Imaging II
Anbo Wang; Yimo Zhang; Yukihiro Ishii, Editor(s)

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