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Proceedings Paper

Wide-range two-dimensional small rotation-angle measurement by use of fringe projection
Author(s): Takamasa Suzuki; Takanori Endo; John E. Greivenkamp; Osami Sasaki
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Paper Abstract

A system for two-dimensional small rotation-angle measurement is proposed and demonstrated. Because the measurement is not conducted by the interference but the fringe projection, it is basically robust for the external disturbance. While the setup is very simple, there is no requirement on the size of the object. We also proposed two-dimensional two-grating method and a unit that miniaturizes the system. Several measurements confirm us that the measurement accuracy of our proposed system is ~0.4 arcsec.

Paper Details

Date Published: 20 January 2005
PDF: 8 pages
Proc. SPIE 5633, Advanced Materials and Devices for Sensing and Imaging II, (20 January 2005); doi: 10.1117/12.580662
Show Author Affiliations
Takamasa Suzuki, Niigata Univ. (Japan)
Takanori Endo, Niigata Univ. (Japan)
John E. Greivenkamp, Optical Sciences Ctr./Univ. of Arizona (United States)
Osami Sasaki, Niigata Univ. (Japan)


Published in SPIE Proceedings Vol. 5633:
Advanced Materials and Devices for Sensing and Imaging II
Anbo Wang; Yimo Zhang; Yukihiro Ishii, Editor(s)

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