Share Email Print

Proceedings Paper

Multiresolution reliability scheme for range image filtering
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

A large number of 3D cameras suffer from so-called holes in the data, i.e. the measurement lattice is affected by invalid measurements and the range image has undefined values. Conventional image filters used for removing the holes perform not well in presence of holes with large varying hole sizes. The novel hole-filling method presented in this paper operates on reliability attributed range images featuring unwanted holes with wide varying sizes. The method operates according to a multi resolution scheme where the image resolution is decreased at the same time as the range reliability is successively increased until sufficient confidence is reached. It builds on three main components. First, the described process performs a weighted local neighbourhood filter where the contribution of each pixel stands for its reliability. Second, the filtering combines filters with different kernel sizes and implements therefore the multi resolution schema. Third, the processing requires a complete travel from high resolution down to the resolution of satisfactory confidence and back again to the highest resolution. The algorithm for the described method was implemented in a efficient way and was widely applied in the hole-filling of range images from a depth from focus process where reliability is obtainable non-linearly from the local sharpness measurement. The method is valid in a very general way for all range imagers providing reliability information. It seems therefore well suited to depth cameras like time-of-flight, stereo and other similar rangers.

Paper Details

Date Published: 16 December 2004
PDF: 8 pages
Proc. SPIE 5606, Two- and Three-Dimensional Vision Systems for Inspection, Control, and Metrology II, (16 December 2004); doi: 10.1117/12.580476
Show Author Affiliations
Thierry Zamofing, Univ. de Neuchatel (Switzerland)
Heinz Hugli, Univ. de Neuchatel (Switzerland)

Published in SPIE Proceedings Vol. 5606:
Two- and Three-Dimensional Vision Systems for Inspection, Control, and Metrology II
Kevin G. Harding, Editor(s)

© SPIE. Terms of Use
Back to Top