Share Email Print

Proceedings Paper

Wavelength-shifting interferometry by a wide tunable laser source with a new phase-shifting technique
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

A wavelength-shifting interferometer has been constructed by using a wide-tunable Ti:sapphire laser for three-dimensional range measurement. The phase shifts in five steps by wavelength changes can be measured with an Schwider-Hariharan algorithm in conjunction with sub-fringe measurements by PZT movements in four steps. Experimental results for a step object have been shown.

Paper Details

Date Published: 20 January 2005
PDF: 5 pages
Proc. SPIE 5633, Advanced Materials and Devices for Sensing and Imaging II, (20 January 2005); doi: 10.1117/12.580464
Show Author Affiliations
Masato Higashi, Univ. of Industrial Technology (Japan)
Takeshi Takahashi, Univ. of Industrial Technology (Japan)
Ribun Onodera, Univ. of Industrial Technology (Japan)
Yukihiro Ishii, Univ. of Industrial Technology (Japan)

Published in SPIE Proceedings Vol. 5633:
Advanced Materials and Devices for Sensing and Imaging II
Anbo Wang; Yimo Zhang; Yukihiro Ishii, Editor(s)

© SPIE. Terms of Use
Back to Top