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Proceedings Paper

Disassembly for valorization in conceptual design
Author(s): Nizar Haoues; Daniel Froelich; Peggy Zwolinski
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Paper Abstract

The valorization rate improvement depends on the product disassembly characteristics. So, researchers develop and implement the Design for Disassembly (DfD) methodology to increase the valorization. The design process of technical products is critical to define the End of Life (EoL) disassembly characteristics of a product. It is the reason why several tools have been developed to evaluate the product disassembly at the end of the design process, when all product characterizations are defined. Nevertheless, it appears that the product disassembly improvement cannot be possible without a real redesigning of the product. In fact, all the existing tools don’t take into account the influence of design parameters on the disassembly results; they focus on the future disassembly process. In previous studies, we have shown that the conceptual design is the most important phase to integrate disassembly constraints in design process. But, this design phase is not addressed by current approach of DfD. We also note that a systematic methodology, which incorporates disassembly evaluation earlier in a design process, is absent. In this paper, we present our proposition concerning a methodological approach to design product easy to disassemble. In our approach, we use a Conceptual Disassembly Model (CDM) to help designers to consider disassembly. A case study is presented to understand the approach and to illustrate our purpose.

Paper Details

Date Published: 8 December 2004
PDF: 12 pages
Proc. SPIE 5583, Environmentally Conscious Manufacturing IV, (8 December 2004); doi: 10.1117/12.580434
Show Author Affiliations
Nizar Haoues, Ecole National des Arts et Métiers (France)
3S INP Grenoble (France)
Daniel Froelich, Ecole National des Arts et Métiers (France)
Peggy Zwolinski, 3S INP Grenoble (France)

Published in SPIE Proceedings Vol. 5583:
Environmentally Conscious Manufacturing IV
Surendra M. Gupta, Editor(s)

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