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Proceedings Paper

Small-signal and large-signal performance test of high-speed optoelectronics devices
Author(s): N. H. Zhu; C. Chen; J. W. Sun; E. Y.B. Pun; P.S. S. Chung
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Paper Abstract

This paper presents measurement methods for determining the reflection coefficients and frequency responses of semiconductor laser diodes, photodiodes, and EA modulator chips. A novel method for determining the intrinsic frequency responses of laser diodes is also proposed, and applications of the developed measurement methods are discussed. We demonstrate the compensation of bonding wire on the capacitances of both the submount and the laser diode, and present a method for estimating the potential modulation bandwidth of TO packaging technique. Initial study on removing the effects of test fixture on large-signal performances of optoelectronic devices at high data rate is also given.

Paper Details

Date Published: 31 January 2005
PDF: 12 pages
Proc. SPIE 5624, Semiconductor and Organic Optoelectronic Materials and Devices, (31 January 2005); doi: 10.1117/12.579690
Show Author Affiliations
N. H. Zhu, Institute of Semiconductors, CAS (China)
C. Chen, Institute of Semiconductors, CAS (China)
J. W. Sun, Institute of Semiconductors, CAS (China)
E. Y.B. Pun, City Univ. of Hong Kong (Hong Kong China)
P.S. S. Chung, City Univ. of Hong Kong (Hong Kong China)

Published in SPIE Proceedings Vol. 5624:
Semiconductor and Organic Optoelectronic Materials and Devices
Chung-En Zah; Yi Luo; Shinji Tsuji, Editor(s)

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