Share Email Print
cover

Proceedings Paper

Characterization of commercial-type vibration exciters by self-mixing interferometry
Author(s): Enver Sadikoglu; Eyup Bilgic; Baki Karaboce
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Electrodynamic vibration exciters are widely used for different purposes. One of their important applications is usage as a vibration generating chain in absolute calibrations of vibration pick-ups. Main requirements for the vibration-generating devices are described in relevant ISO standard. These requirements are the total harmonic distortion of the acceleration, transverse, bending and rocking motion, hum and noise level, and the acceleration amplitude stability. The bending, rocking and transverse accelerations are the properties that belonging entirely to the vibration exciter. Contribution of these effects to the overall calibration uncertainty is not as small as to be assumed negligible. Investigation of the motional behavior of some of the commercial electrodynamic exciters by self-mixing interferometry has been carried out at Turkish National Metrology Institute (UME). Interferometer in configuration of the external cavity diodes laser (ECDL) constructed at UME was used for the characterization of the exciters' surface displacement in the medium frequency range.

Paper Details

Date Published: 22 June 2004
PDF: 4 pages
Proc. SPIE 5503, Sixth International Conference on Vibration Measurements by Laser Techniques: Advances and Applications, (22 June 2004); doi: 10.1117/12.579620
Show Author Affiliations
Enver Sadikoglu, TUBITAK Ulusal Metroloji Enstitusu (Turkey)
Eyup Bilgic, TUBITAK Ulusal Metroloji Enstitusu (Turkey)
Baki Karaboce, TUBITAK Ulusal Metroloji Enstitusu (Turkey)


Published in SPIE Proceedings Vol. 5503:
Sixth International Conference on Vibration Measurements by Laser Techniques: Advances and Applications
Enrico Primo Tomasini, Editor(s)

© SPIE. Terms of Use
Back to Top