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Proceedings Paper

Ultrashort-pulse EUV and soft x-ray sources based on high-harmonic generation: principles and applications
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Paper Abstract

High harmonic generation (HHG) is a useful source of coherent light in the extreme ultraviolet (EUV) region of the spectrum. However, both the conversion efficiency and the highest achievable photon energy have in the past been limited in the past by the inability to phase-match the frequency conversion process. In this paper, we summarize recent results on the development of new techniques for phase-matching the high-harmonic conversion process. We also summarize finding from three series of experiments that make use of the coherent EUV light generated using HHG: 1) probing of acoustic dynamics in materials; 2) monitoring of chemical dynamics at surfaces using photoelectron spectroscopy; and 3) time-resolved plasma imaging.

Paper Details

Date Published: 17 March 2005
PDF: 6 pages
Proc. SPIE 5580, 26th International Congress on High-Speed Photography and Photonics, (17 March 2005); doi: 10.1117/12.579521
Show Author Affiliations
Ra'anan Tobey, Univ. of Colorado/Boulder (United States)
National Institute of Standards and Technology (United States)
Daisy Raymondson, Univ. of Colorado/Boulder (United States)
National Institute of Standards and Technology (United States)
Emily A. Gibson, Univ. of Colorado/Boulder (United States)
National Institute of Standards and Technology (United States)
Chi-Fong Lei, Univ. of Colorado/Boulder (United States)
National Institute of Standards and Technology (United States)
Ariel Paul, Univ. of Colorado/Boulder (United States)
National Institute of Standards and Technology (United States)
Sterling Backus, Univ. of Colorado/Boulder (United States)
National Institute of Standards and Technology (United States)
Mark Siemens, Univ. of Colorado/Boulder (United States)
National Institute of Standards and Technology (United States)
Xiaoshi Zhang, Univ. of Colorado/Boulder (United States)
National Institute of Standards and Technology (United States)
Margaret M. Murnane, Univ. of Colorado/Boulder (United States)
National Institute of Standards and Technology (United States)
Henry C. Kapteyn, Univ. of Colorado/Boulder (United States)
National Institute of Standards and Technology (United States)


Published in SPIE Proceedings Vol. 5580:
26th International Congress on High-Speed Photography and Photonics
Dennis L. Paisley; Stuart Kleinfelder; Donald R. Snyder; Brian J. Thompson, Editor(s)

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