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Proceedings Paper

QWIP chip dual-color and multicolor FPAs for military applications
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Paper Abstract

Quantum Well Infrared Photodetectors (QWIPs) based infrared focal plane arrays (FPAs) are commercially available in the single color. QWIP Technologies, Inc. provides a number of QWIPCHIPTM FPAs available in the single-color, dual-color and even multiple-color, as well as varieties of physical formats in the infrared range. In this paper, we discuss the research and development efforts currently ongoing at QWIP Technologies on dual-color, visible-NIR/LWIR FPAs, and the development of a four-color QWIP-based FPA. These multicolor systems are being developed to meet the needs of a number of military applications including land mine detection. Land mines inhibit the safe movement of troops and produce chaos in countries struggling for socio-economic stability long after the cessation of hostilities. This paper will describe the efforts to develop a near multi-color QWIP sensor for mine detection. The core of the discussion will include highlights of a two-color LWIR QWIP sensor system designed to provide uniform, high spatial resolution, multi-color co-registered imagery and possess negligible spectral cross-talk. Through these efforts, The Defense Advanced Research Projects Agency (DARPA) is completing the development of a visible/infrared mine detection system, which when deployed on an airborne platform, would increase the war fighting effectiveness has sponsored the current developments.

Paper Details

Date Published: 6 December 2004
PDF: 12 pages
Proc. SPIE 5612, Electro-Optical and Infrared Systems: Technology and Applications, (6 December 2004); doi: 10.1117/12.579456
Show Author Affiliations
Barbara K. McQuiston, QWIP Technologies, Inc. (United States)
Eric Cho, QWIP Technologies, Inc. (United States)
Wah Lim, QWIP Technologies, Inc. (United States)
Sir B. Rafol, QWIP Technologies, Inc. (United States)
Sarath D. Gunapala, Jet Propulsion Lab. (United States)
Sumith V. Bandara, Jet Propulsion Lab. (United States)
John K. Liu, Jet Propulsion Lab. (United States)

Published in SPIE Proceedings Vol. 5612:
Electro-Optical and Infrared Systems: Technology and Applications
Ronald G. Driggers; David A. Huckridge, Editor(s)

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