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Proceedings Paper

IRFPA modeling: examples and applications in SWIR and LWIR
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Paper Abstract

Automotive security is an increasing concern which requires new visual and detection system. Infrared imaging is a very good technological tool to perform such security enhancement. LETI Infrared Laboratory, as a IR technology designer, is a partner in the studies and development of such system for vision enhancement or security system analysis. Thus, we have developed two behavioural models of infrared focal plane array detectors: one in the Short Wave IR and the other in the Long Wave IR band. These detector models are used either in simulation platform aimed at evaluating the impact and use of infrared sensors in automotive and aeronautic applications or in order to test image processing algorithm on virtual component up to come. This work is a part of European Commission projects. The SWIR detector is calibrated with a 320x240 HgCdTe cooled FPA component from SOFRADIR and the LWIR one with an uncooled micro-bolometer array from ULIS (aSi:H microbolometer technology from LETI). The flexibility of the models permits to simulate cameras based on these component or new ones, using different read-out circuit or detector technologies. In this paper we present the detector models and its achievement through electro-optical measurements and their applications.

Paper Details

Date Published: 6 December 2004
PDF: 11 pages
Proc. SPIE 5612, Electro-Optical and Infrared Systems: Technology and Applications, (6 December 2004); doi: 10.1117/12.579358
Show Author Affiliations
Alain Durand, CEA/LETI Grenoble (France)
Eric de Borniol, CEA/LETI Grenoble (France)
Regis Vinciguerra, CEA Saclay (France)
Thierry Cathala, OKTAL SE (France)
Jean Jacques Yon, CEA/LETI Grenoble (France)
Pierre Castelein, CEA/LETI Grenoble (France)
Robert Tronel, CEA/LETI Grenoble (France)
Gerard L. Destefanis, CEA/LETI Grenoble (France)


Published in SPIE Proceedings Vol. 5612:
Electro-Optical and Infrared Systems: Technology and Applications
Ronald G. Driggers; David A. Huckridge, Editor(s)

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