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Proceedings Paper

Determination of the phase- and polarization-changing properties of reflective spatial light modulators in one set-up
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Paper Abstract

The use of liquid crystal spatial light modulators in applications, require good characterization of phase, polarization and amplitude shifting properties. This report presents a new approach for simultaneously characterizing the depolarization and controlling the polarization properties of a reflective twisted nematic liquid crystal spatial light modulator (LC SLM). The SLM was set up as a part of a Michelson interferometer. The phase response was determined by using a piezo-electric actuator for phase stepping in the reference arm. During the polarization measurement the reference beam was removed and the polarization state of the input and output was determined by a polarization state generator (PSG) and a polarization state analyzer (PSA), each consisting of a polarizer and a quarter-wave plate. Hereby, both phase response and polarization control properties could be determined independently in the same measurement configuration simply by changing static polarization components. The systematic rotation of the quarter wave plates of the PSG and the PSA using stepper motors gives out-put data whose Fourier transform in terms of angular frequency components can be used to determine all the elements of the Mueller matrix. The Mueller matrix of a commercial SLM (Holoeye LC-2500) was determined for 17 evenly spaced voltage levels addressed to the SLM.

Paper Details

Date Published: 30 November 2004
PDF: 9 pages
Proc. SPIE 5618, Integrated Optical Devices, Nanostructures, and Displays, (30 November 2004); doi: 10.1117/12.578438
Show Author Affiliations
Frantz Stabo-Eeg, Norwegian Univ. of Science and Technology (Norway)
Kay Gastinger, SINTEF ICT Photonics (Norway)
Ola D. Hunderi, Norwegian Univ. of Science and Technology (Norway)
Mikael Lindgren, Norwegian Univ. of Science and Technology (Norway)


Published in SPIE Proceedings Vol. 5618:
Integrated Optical Devices, Nanostructures, and Displays
Keith L. Lewis, Editor(s)

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