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Proceedings Paper

Machine vision method for small feature measurements
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Paper Abstract

Small features such as bevels and edge profiles are a common and often critical feature on many manufactured parts. In the past, the only ways to measure such features was to make a wax mold of the feature and slice it for measurement on an optical comparator, or to do a slow mechanical tracing with a stylus or CMM type measurement system. This paper describes the application of machine vision tools, using controlled lighting to highlight shape information such as curvature, combined with 2D vision processing to extract the 3D shape based upon surface modeling.

Paper Details

Date Published: 16 December 2004
PDF: 8 pages
Proc. SPIE 5606, Two- and Three-Dimensional Vision Systems for Inspection, Control, and Metrology II, (16 December 2004); doi: 10.1117/12.577949
Show Author Affiliations
Kevin G. Harding, GE Global Research Ctr. (United States)
Shu-Guo Gordon Tang, GE Global Research Ctr. (United States)


Published in SPIE Proceedings Vol. 5606:
Two- and Three-Dimensional Vision Systems for Inspection, Control, and Metrology II
Kevin G. Harding, Editor(s)

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