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Proceedings Paper

Development of automatic inspection of defect of compact camera module
Author(s): Kuk Won Ko; Yu Jin Lee; Beong Wuk Choi; Kyoung Cheol Koh; Jong Hyeong Kim
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Paper Abstract

Compact Camera Module(CCM) is widely used in PDA, Celluar phone and PC web camera. With the greatly increasing use for mobile applications, there has been a considerable demands for high speed production of CCM. The major burden of production of CCM is assembly of lens module onto CCD or CMOS packaged circuit board. After module is assembled, the CCM is inspected. In this paper, we developed the image capture board for CCM and the imaging processing algorithm to inspect the defects in captured image of assembled CCMO. The performances of the developed inspection system and its algorithm are tested on samples of 10000 CCMs. Experimental results reveal that the proposed system can focus the lens of CCM within 5s and we can recognize various types of defect of CCM modules with good accuracy and high speed.

Paper Details

Date Published: 25 October 2004
PDF: 8 pages
Proc. SPIE 5603, Machine Vision and its Optomechatronic Applications, (25 October 2004); doi: 10.1117/12.577570
Show Author Affiliations
Kuk Won Ko, Sunmoon Univ. (South Korea)
Yu Jin Lee, Sunmoon Univ. (South Korea)
Beong Wuk Choi, Sunmoon Univ. (South Korea)
Kyoung Cheol Koh, Sunmoon Univ. (South Korea)
Jong Hyeong Kim, Seoul National Univ. of Technology (South Korea)

Published in SPIE Proceedings Vol. 5603:
Machine Vision and its Optomechatronic Applications
Shun'ichi Kaneko; Hyungsuck Cho; George K. Knopf; Rainer Tutsch, Editor(s)

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