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Proceedings Paper

Influence of edge error on MTF
Author(s): Chun-mei Xu; Wei Zhang; Gang Li; Chu Zhang
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Paper Abstract

Using a knife-edge to measure the MTF of optical system is a basic way, the paper discuss the influence of slit edge error on MTF by building a mathematical model. The quantitative analysis result was given that it can reach the given precision by only measuring limited area. The qualitative analysis result was also given that fitting-curve-method is better than averaging method for precision.

Paper Details

Date Published: 10 February 2005
PDF: 6 pages
Proc. SPIE 5638, Optical Design and Testing II, (10 February 2005); doi: 10.1117/12.576810
Show Author Affiliations
Chun-mei Xu, Ordnance Engineering College (China)
Wei Zhang, Ordnance Engineering College (China)
Gang Li, Ordnance Engineering College (China)
Chu Zhang, Ordnance Engineering College (China)


Published in SPIE Proceedings Vol. 5638:
Optical Design and Testing II
Yongtian Wang; Zhicheng Weng; Shenghua Ye; Jose M. Sasian, Editor(s)

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