Share Email Print
cover

Proceedings Paper

Measurement of sectional profile of a thread gauge using a sinusoidally vibrating light with sinusoidal intensity
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

A method is proposed for accurately measuring a sectional profile of a thread gauge. In this method a sinusoidally vibrating sinusoidal intensity (SVSI) is used to generate an exact spatial scale along one direction. Lights from top points of a thread gauge surface are extracted by spatial filtering in an afocal imaging system to form an image of the top points. A time-varying signal is detected in the image, and a sectional profile of the thread gauge is measured from the phase of the detected signal on a position where the amplitude of the signal has a maximum value. Detection of the amplitude and the phase is carried out easily and exactly with sinusoidal phase-modulating interferometry.

Paper Details

Date Published: 20 January 2005
PDF: 6 pages
Proc. SPIE 5633, Advanced Materials and Devices for Sensing and Imaging II, (20 January 2005); doi: 10.1117/12.576666
Show Author Affiliations
Jinhuan Li, Niigata Univ. (Japan)
Osami Sasaki, Niigata Univ. (Japan)
Takamasa Suzuki, Niigata Univ. (Japan)


Published in SPIE Proceedings Vol. 5633:
Advanced Materials and Devices for Sensing and Imaging II
Anbo Wang; Yimo Zhang; Yukihiro Ishii, Editor(s)

© SPIE. Terms of Use
Back to Top