Share Email Print

Proceedings Paper

The position relationship in multi-interferograms
Author(s): Wei Wang; Qing Wang; Yong He; Lei Chen
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

In the high accuracy absolute interferometry, several interferograms from different objects has to be calculated. This paper introduces a technique that ensures the spatial positions of the interferograms coinciding correctly (spatial unity). In this technique the characteristic parameters of interferograms’ position are picked up in the sample matrix coordinates system. And all these characteristic parameters are compared and fed back to the operator. Then the operator aligns the optical path precisely until it achieves the conditions for the absolute measurement. Computer guards the whole process, so the results are more reliability. The absolute measurement of cylindrical surface using this method has been realized and high-accuracy results are obtained.

Paper Details

Date Published: 10 February 2005
PDF: 5 pages
Proc. SPIE 5638, Optical Design and Testing II, (10 February 2005); doi: 10.1117/12.576440
Show Author Affiliations
Wei Wang, Nanjing Univ. of Science and Technology (China)
Qing Wang, Nanjing Univ. of Science and Technology (China)
Yong He, Nanjing Univ. of Science and Technology (China)
Lei Chen, Nanjing Univ. of Science and Technology (China)

Published in SPIE Proceedings Vol. 5638:
Optical Design and Testing II
Yongtian Wang; Zhicheng Weng; Shenghua Ye; Jose M. Sasian, Editor(s)

© SPIE. Terms of Use
Back to Top