Share Email Print

Proceedings Paper

Study of the relationship between scattering-light energy characteristic of dust particles and the dust emission using a two-dimensional image sensor
Author(s): Guanling Yang; Zhenjiang He; Peng Han; YongChang Yu; Leishou Yu; Li Peng
Format Member Price Non-Member Price
PDF $17.00 $21.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

This paper describes a technique that inspects the dust emission volume by scattering-light energy characteristic of the dust particles. The scattering-light energy characteristic information, including total energy, peek value energy and the positions of peek value energy, are extracted from the scattering light received by a two-dimension cuneal image sensor. A common inspecting principle of dust emission volume and the two-dimension cuneal image sensor that realizes the measurement of scattering-light energy are discussed. According to the characteristic that the real part of refractive index influences less on the normalized distribution of scattering light the angle smaller than 30°, the center of a two-dimension cuneal image sensor is placed at the optical axis of focal plane of Fourier lens and is capable of receiving scattering light energy within forward angle 2.8°. Experiments were made with a simulating dust emitting experimental instrument and obtained scattering light energy characteristic information for dust emission volume 50mg, 100mg, 150mg, 200mg, 300mg, 400mg, 500mg and 600mg. We point out that dust emission volume can be inspected by scattering-light energy characteristic, and suggest that it is necessary to establish a database that shows the relationship between dust emission volume and scattering-light energy and to measure the size distribution of dust particles.

Paper Details

Date Published: 20 January 2005
PDF: 9 pages
Proc. SPIE 5633, Advanced Materials and Devices for Sensing and Imaging II, (20 January 2005); doi: 10.1117/12.576097
Show Author Affiliations
Guanling Yang, South China Normal Univ. (China)
Zhenjiang He, South China Normal Univ. (China)
Peng Han, South China Normal Univ. (China)
YongChang Yu, South China Normal Univ. (China)
Leishou Yu, South China Normal Univ. (China)
Li Peng, South China Normal Univ. (China)

Published in SPIE Proceedings Vol. 5633:
Advanced Materials and Devices for Sensing and Imaging II
Anbo Wang; Yimo Zhang; Yukihiro Ishii, Editor(s)

© SPIE. Terms of Use
Back to Top