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Proceedings Paper

Test method for evaluating optical disk reliability
Author(s): Mitsuru Irie; Yoshihiro Okino; Takahiro Kubo
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Paper Abstract

This study examined a lifetime estimation method for optical disks. It is based on the Eyring acceleration model and statistical analysis. The statistical distribution of life data for the optical disk assumed a lognormal distribution. Analysis of statistical techniques based on the ISO standard is proposed as a life expectancy prediction method for CD-R disks. The standardized life expectancy of an optical disk is defined as the minimum lifetime of 95% survival probability at 25/50%RH with a 95% confidence level. An acceleration test was conducted using a high-density optical disk under stress conditions of temperature and relative humidity. Consequently, we confirmed the capability of this method for estimating life expectancy by considering the stresses of temperature and relative humidity, and providing for a confidence level. The statistical distribution function of optical disk lifetime data must be clarified experimentally to apply this technique to lifetime estimation of optical disks in the future.

Paper Details

Date Published: 3 January 2005
PDF: 6 pages
Proc. SPIE 5643, Advances in Optical Data Storage Technology, (3 January 2005); doi: 10.1117/12.575707
Show Author Affiliations
Mitsuru Irie, Osaka Sangyo Univ. (Japan)
Yoshihiro Okino, Kansai Univ. (Japan)
Takahiro Kubo, T. Kubo Engineering Science Office (Japan)

Published in SPIE Proceedings Vol. 5643:
Advances in Optical Data Storage Technology
Duanyi Xu; Kees A. Schouhamer Immink; Keiji Shono, Editor(s)

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