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Proceedings Paper

Interferometer for endface geometry parameter measurement of optical fiber connector
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Proc. SPIE 5638, Optical Design and Testing II, ; doi: 10.1117/12.575108
Show Author Affiliations
Yuangang Lu, Shanghai Institute of Optics and Fine Mechanics (China)
Xiangzhao Wang, Shanghai Institute of Optics and Fine Mechanics (China)
Xianghong Zhong, Shanghai Institute of Optics and Fine Mechanics (China)


Published in SPIE Proceedings Vol. 5638:
Optical Design and Testing II
Yongtian Wang; Zhicheng Weng; Shenghua Ye; Jose M. Sasian, Editor(s)

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