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Proceedings Paper

Measurement of high-temperature clinker’s thickness based on CCD
Author(s): Haibin Li; Wenjun Shan; Shuang Liu; Bin Liu
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Proc. SPIE 5634, Advanced Sensor Systems and Applications II, ; doi: 10.1117/12.575056
Show Author Affiliations
Haibin Li, Yanshan Univ. (China)
Wenjun Shan, Yanshan Univ. (China)
Shuang Liu, Yanshan Univ. (China)
Bin Liu, Yanshan Univ. (China)


Published in SPIE Proceedings Vol. 5634:
Advanced Sensor Systems and Applications II
Yun-Jiang Rao; Osuk Y. Kwon; Gang-Ding Peng, Editor(s)

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