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Proceedings Paper

Projection moire as a tool for the automated determination of surface topography
Author(s): Jaime F. Cardenas-Garcia; S. Zheng; F. Z. Shen
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Paper Details

Date Published: 30 December 1991
PDF: 15 pages
Proc. SPIE 1554B, Second Intl Conf on Photomechanics and Speckle Metrology: Moire Techniques, Holographic Interferometry, Optical NDT, and Applications to Fluid Mechanics, (30 December 1991); doi: 10.1117/12.57490
Show Author Affiliations
Jaime F. Cardenas-Garcia, Texas Tech Univ. (United States)
S. Zheng, Texas Tech Univ. (United States)
F. Z. Shen, Texas Tech Univ. (United States)


Published in SPIE Proceedings Vol. 1554B:
Second Intl Conf on Photomechanics and Speckle Metrology: Moire Techniques, Holographic Interferometry, Optical NDT, and Applications to Fluid Mechanics
Fu-Pen Chiang, Editor(s)

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