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Proceedings Paper

Development of electron moire method using a scanning electron microscope
Author(s): Satoshi Kishimoto; Mitsuru Egashira; Norio Shinya
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Paper Details

Date Published: 30 December 1991
PDF: 7 pages
Proc. SPIE 1554B, Second Intl Conf on Photomechanics and Speckle Metrology: Moire Techniques, Holographic Interferometry, Optical NDT, and Applications to Fluid Mechanics, (30 December 1991); doi: 10.1117/12.57487
Show Author Affiliations
Satoshi Kishimoto, National Research Institute for Metals (Japan)
Mitsuru Egashira, National Research Institute for Metals (Japan)
Norio Shinya, National Research Institute for Metals (Japan)


Published in SPIE Proceedings Vol. 1554B:
Second Intl Conf on Photomechanics and Speckle Metrology: Moire Techniques, Holographic Interferometry, Optical NDT, and Applications to Fluid Mechanics
Fu-Pen Chiang, Editor(s)

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