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Proceedings Paper

Quantitative analysis of contact deformation using holographic interferometry and speckle photography
Author(s): Jin W. Joo; Young Ha Kwon; Seung Ok Park
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Paper Abstract

The optical technique combined the holographic interferometry and speckle photography was applied to measure three dimensional deformation. Out-of-plane and in-plane displacements of the contact deformation were determined experimentally and compared with the numerical analysis. The experimental results are in good agreement with the numerical results.

Paper Details

Date Published: 1 December 1991
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Proc. SPIE 1554, Second International Conference on Photomechanics and Speckle Metrology, (1 December 1991); doi: 10.1117/12.57479
Show Author Affiliations
Jin W. Joo, Korea Standards Research Institute (South Korea)
Young Ha Kwon, Korea Standards Research Institute (South Korea)
Seung Ok Park, Korea Standards Research Institute (South Korea)


Published in SPIE Proceedings Vol. 1554:
Second International Conference on Photomechanics and Speckle Metrology
Fu-Pen Chiang; Fu-Pen Chiang, Editor(s)

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