Share Email Print
cover

Proceedings Paper

Multilaser digital speckle pattern interferometry system
Author(s): Shuhai Jia; Junwu Zhao; Xin Wang
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

A novel digital speckle pattern interferometry system including multi lower power He-Ne lasers to measure large object is presented in this paper. Multi lower power He-Ne lasers and optical switches are set in it. Through the control of computer, the different laser can illuminate the different area of large object at different time. Then the phase maps corresponding to different area are jointed together to obtain the measurement result of entire object by using proper image mosaic algorithm. Using this method, the contradiction between laser power and size of object to be measured is overcome. In this system, the high coherence of He-Ne laser and the power of multi lasers are comprehensively used, which makes it be able to measure the large object in practical engineering. At the same time, the speckle pattern fringes with high quality can be obtained.

Paper Details

Date Published: 20 January 2005
PDF: 5 pages
Proc. SPIE 5633, Advanced Materials and Devices for Sensing and Imaging II, (20 January 2005); doi: 10.1117/12.574770
Show Author Affiliations
Shuhai Jia, Xi’an Jiaotong Univ. (China)
Junwu Zhao, Xi’an Jiaotong Univ. (China)
Xin Wang, Xi’an Jiaotong Univ. (China)


Published in SPIE Proceedings Vol. 5633:
Advanced Materials and Devices for Sensing and Imaging II
Anbo Wang; Yimo Zhang; Yukihiro Ishii, Editor(s)

© SPIE. Terms of Use
Back to Top