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Proceedings Paper

Electronic shearography versus ESPI in nondestructive evaluation
Author(s): Y.Y. Hung
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Paper Details

Date Published: 30 December 1991
PDF: 9 pages
Proc. SPIE 1554B, Second Intl Conf on Photomechanics and Speckle Metrology: Moire Techniques, Holographic Interferometry, Optical NDT, and Applications to Fluid Mechanics, (30 December 1991); doi: 10.1117/12.57459
Show Author Affiliations
Y.Y. Hung, Oakland Univ. (United States)


Published in SPIE Proceedings Vol. 1554B:
Second Intl Conf on Photomechanics and Speckle Metrology: Moire Techniques, Holographic Interferometry, Optical NDT, and Applications to Fluid Mechanics
Fu-Pen Chiang, Editor(s)

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