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Proceedings Paper

Electronic shearography versus ESPI in nondestructive evaluation
Author(s): Y.Y. Hung
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Paper Abstract

This paper will give a review of two major optical methods of nondestructive testing: ESPI and electronic shearography. A comparison of the two techniques is also presented.

Paper Details

Date Published: 1 December 1991
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Proc. SPIE 1554, Second International Conference on Photomechanics and Speckle Metrology, (1 December 1991); doi: 10.1117/12.57459
Show Author Affiliations
Y.Y. Hung, Oakland Univ. (United States)


Published in SPIE Proceedings Vol. 1554:
Second International Conference on Photomechanics and Speckle Metrology
Fu-Pen Chiang; Fu-Pen Chiang, Editor(s)

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