Share Email Print
cover

Proceedings Paper

Spatial phase-shifting techniques of fringe pattern analysis in photomechanics
Author(s): Malgorzata Kujawinska; Joanna Wojiak
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

The spatial phase-shifting techniques providing the robust technique for displacement, shape and deformation measurement are presented, specifically the phase-stepped (PS) and spatial-carrier phase-shifting methods (SCPS). The first technique requires modification of holographic, speckle and moiré interferometers by inserting an additional grating and forming three parallel channels with phase-shifted interferograms. In the second technique a large amount of tilt is introduced into a fringe pattern, so that the phase difference between succesive pixels equals a known, constant value (e.g. Π/2).

As both techniques require for the phase calculation a single frame only, they are specially capable for the analysis of transient events and for performing measurements in adverse conditions. The error considerations and the examples of applications of this methods are presented. The advantages and disadvantages of these two spatial methods in comparison with temporal phase-shifting technique are given.

Paper Details

Date Published: 1 December 1991
PDF
Proc. SPIE 1554, Second International Conference on Photomechanics and Speckle Metrology, (1 December 1991); doi: 10.1117/12.57434
Show Author Affiliations
Malgorzata Kujawinska, Warsaw Univ. of Technology (Poland)
Joanna Wojiak, Warsaw Univ. of Technology (Poland)


Published in SPIE Proceedings Vol. 1554:
Second International Conference on Photomechanics and Speckle Metrology
Fu-Pen Chiang; Fu-Pen Chiang, Editor(s)

© SPIE. Terms of Use
Back to Top