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Proceedings Paper

Moiré topography with the aid of phase-shift method
Author(s): Toru Yoshizawa; Teiyu Tomisawa
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Paper Abstract

Moiré topography has been utilized as a practical method for three-dimensional measurement in various industrial and medical fields. However, such shortcomings inherent to conventional moiré topography as low resolution and difficulties in computation are indicated. This means that the measuring points are restricted to points on the contours and that identification of convex or convex of the surface shape is impossible using one moiré picture. These problems are expected to be overcome by phase shift method.

Paper Details

Date Published: 1 December 1991
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Proc. SPIE 1554, Second International Conference on Photomechanics and Speckle Metrology, (1 December 1991); doi: 10.1117/12.57429
Show Author Affiliations
Toru Yoshizawa, Tokyo Univ. of Agriculture and Technology (Japan)
Teiyu Tomisawa, Tokyo Univ. of Agriculture and Technology (Japan)


Published in SPIE Proceedings Vol. 1554:
Second International Conference on Photomechanics and Speckle Metrology
Fu-Pen Chiang; Fu-Pen Chiang, Editor(s)

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