Share Email Print

Proceedings Paper

Electron-beam bunch length monitor based on electro-optic detection technique
Author(s): Jingling Shen; Steven P. Jamison; Giel Berden
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

We described an electro-optic detection technique-chirped-pulse cross correlation technique for measurement of an electron-beam bunch length. This is a high temporal resolution, single shot technique compared with the other two electro-optic detection techniques: the delay-scan method and the chirped-pulse spectrometer method. In delay-scan method temporal resolution is high, but measurement speed is not ideal. Although in the method of chirped-pulse spectrometer is single-shot with a high measurement speed, the temporal resolution is limited, which has been proved theoretically and experimentally. In chirped-pulse cross correlation technique, resolution and measurement speed are both satisfied. The technique is used to measure electron-beam bunch length in an accelerator.

Paper Details

Date Published: 28 January 2005
PDF: 6 pages
Proc. SPIE 5646, Nonlinear Optical Phenomena and Applications, (28 January 2005); doi: 10.1117/12.574262
Show Author Affiliations
Jingling Shen, Capital Normal Univ. (China)
Steven P. Jamison, Univ. of Abertay Dundee (United Kingdom)
Giel Berden, FOM Institute for Plasma Physics Rijnhuizen (Netherlands)

Published in SPIE Proceedings Vol. 5646:
Nonlinear Optical Phenomena and Applications
Qihuang Gong; Yiping Cui; Roger A. Lessard, Editor(s)

© SPIE. Terms of Use
Back to Top