Share Email Print
cover

Proceedings Paper

Evaluation of a new electrical resistance shear-strain gauge using moiré interferometry
Author(s): Peter G. Ifju
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

Moiré interferometry was used as an independent means to measure the average shear strain recorded by a specialized "shear gage". The shear gage was developed to record the shear stiffness of unidirectional, multidirectional, woven and chopped fiber composite materials. A moiré grating was replicated directly on top of the gage on the Iosipescu and compact double notched specimens. Fringe patterns revealed the deformations of the gage and the shear strain distributions were extracted and averaged.

Paper Details

Date Published: 1 December 1991
PDF
Proc. SPIE 1554, Second International Conference on Photomechanics and Speckle Metrology, (1 December 1991); doi: 10.1117/12.57426
Show Author Affiliations
Peter G. Ifju, Virginia Polytechnic Institute and State Univ. (United States)


Published in SPIE Proceedings Vol. 1554:
Second International Conference on Photomechanics and Speckle Metrology
Fu-Pen Chiang; Fu-Pen Chiang, Editor(s)

© SPIE. Terms of Use
Back to Top