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Proceedings Paper

Vibration-insensitive moire interferometry system for off-table applications
Author(s): Yifan Guo
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Paper Abstract

In this paper a new Moiré interferometry system is introduced. This system is relatively insensitive to vibrations and can perform high sensitivity displacement measurements off optical tables, for example, in a material testing laboratory. This development is very important in expanding applications of the high sensitivity Moiré interferometry technique to a broad experimental analysis of mechanical properties of various materials and structures.

Paper Details

Date Published: 1 December 1991
Proc. SPIE 1554, Second International Conference on Photomechanics and Speckle Metrology, (1 December 1991); doi: 10.1117/12.57425
Show Author Affiliations
Yifan Guo, IBM Corp. (United States)

Published in SPIE Proceedings Vol. 1554:
Second International Conference on Photomechanics and Speckle Metrology
Fu-Pen Chiang; Fu-Pen Chiang, Editor(s)

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