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Proceedings Paper

Growth and fluorescence characteristics of Cr3+ : YAG crystal fiber for temperature sensor from –10 degrees C to 500 degrees C
Author(s): Linhua Ye; Yanqing Qiu; Jinlei He; Yonghang Shen; Sailing He
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Paper Abstract

The temperature-dependent characteristics of fluorescence of transient-metal doped and/or rare-earth-doped YAG has made these materials the focus of fluorescence thermometer. This article reports growth and fluorescence characteristics of Cr3+: YAG crystal fiber used for thermometer based on fluorescence decay time. Using a long pure YAG crystal fiber as the seed and a 0.1 at. % Cr2O3-doped Y3Al5O12 sintered powder rod as the source rod, a YAG fiber thermal probe with Cr3+-ions doped end was grown by laser heated pedestal growth method. The crystal fiber shows good optical properties and mechanical strength and offers advantages of compact construct, high performance and ability to withstand high temperature. The fluorescence decay characteristics of the crystal fiber, including the temperature dependence of both fluorescence decay time and intensity, were comprehensively investigated. The experimental results indicated the Cr3+:YAG crystal fiber showed a monotonic relationship between the fluorescence lifetime and temperature over a wide temperature range from cryogenic to high temperature(>500°C). The fiber was found to be an excellent candidate material to be used as a fiber thermometer based on fluorescence lifetime. This thermometer may be used as temperature monitor in microwave treatment and Medium Voltage substations.

Paper Details

Date Published: 20 January 2005
PDF: 8 pages
Proc. SPIE 5633, Advanced Materials and Devices for Sensing and Imaging II, (20 January 2005); doi: 10.1117/12.573932
Show Author Affiliations
Linhua Ye, Zhejiang Univ. (China)
Yanqing Qiu, Zhejiang Univ. (China)
Jinlei He, Zhejiang Univ. (China)
Yonghang Shen, Zhejiang Univ. (China)
Sailing He, Zhejiang Univ. (China)

Published in SPIE Proceedings Vol. 5633:
Advanced Materials and Devices for Sensing and Imaging II
Anbo Wang; Yimo Zhang; Yukihiro Ishii, Editor(s)

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