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Proceedings Paper

High-sensitivity photon-counting imaging detector
Author(s): Lichen Fu; Ye Li; Qingduo Duanmu; Guozheng Wang; Kui Wu; Delong Jiang; Jingquan Tian
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Paper Abstract

Theoretical foundation and principle programmer will be studied in this paper that special photosensitive Si-PSD (Si-Position Sensitive Detector) is rebuilt into electron bombardment mode device, which is based on minimal weak light detecting technical demands and exciting principle of high-energy electronic beam acting on silicon semiconductor. At the same time we will bring forward new concept device of electron bombardment mode PSD. According to the theoretical foundation and principle programmer, we present the practical measurement result that semiconductor gain of electron bombardment mode device is obtained. When incident electron energy is more than 4KeV, then obtained more than 103 gain. We have produced high-sensitivity photon-counting imaging detector (MCP-PSD tube) with 108~109 gain, which combined the research of microchannel plate (MCP) cascade applications with electron bombardment mode device. This paper also will present the substantial photograph of electron bombardment mode PSD device and MCP-PSD tube. Finally we will bring forward prospect realizing detection of minimal weak light photon-counting imaging.

Paper Details

Date Published: 20 January 2005
PDF: 4 pages
Proc. SPIE 5633, Advanced Materials and Devices for Sensing and Imaging II, (20 January 2005); doi: 10.1117/12.573843
Show Author Affiliations
Lichen Fu, Changchun Univ. of Science and Technology (China)
Ye Li, Changchun Univ. of Science and Technology (China)
Qingduo Duanmu, Changchun Univ. of Science and Technology (China)
Guozheng Wang, Changchun Univ. of Science and Technology (China)
Kui Wu, Changchun Univ. of Science and Technology (China)
Delong Jiang, Changchun Univ. of Science and Technology (China)
Jingquan Tian, Changchun Univ. of Science and Technology (China)


Published in SPIE Proceedings Vol. 5633:
Advanced Materials and Devices for Sensing and Imaging II
Anbo Wang; Yimo Zhang; Yukihiro Ishii, Editor(s)

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