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Proceedings Paper

Research on infrared-image denoising algorithm based on the noise analysis of the detector
Author(s): Songtao Liu; Xiaodong Zhou; Tongsheng Shen; Yanli Han
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Paper Abstract

Since the conventional denoising algorithms have not considered the influence of certain concrete detector, they are not very effective to remove various noises contained in the low signal-to-noise ration infrared image. In this paper, a new thinking for infrared image denoising is proposed, which is based on the noise analyses of detector with an example of L model infrared multi-element detector. According to the noise analyses of this detector, the emphasis is placed on how to filter white noise and fractal noise in the preprocessing phase. Wavelet analysis is a good tool for analyzing 1/f process. 1/f process can be viewed as white noise approximately since its wavelet coefficients are stationary and uncorrelated. So if wavelet transform is adopted, the problem of removing white noise and fraction noise is simplified as the only one problem, i.e., removing white noise. To address this problem, a new wavelet domain adaptive wiener filtering algorithm is presented. From the viewpoint of quantitative and qualitative analyses, the filtering effect of our method is compared with those of traditional median filter, mean filter and wavelet thresholding algorithm in detail. The results show that our method can reduce various noises effectively and raise the ratio of signal-to-noise evidently.

Paper Details

Date Published: 10 January 2005
PDF: 8 pages
Proc. SPIE 5640, Infrared Components and Their Applications, (10 January 2005); doi: 10.1117/12.573806
Show Author Affiliations
Songtao Liu, Naval Aeronautical Engineering Institute (China)
Xiaodong Zhou, Naval Aeronautical Engineering Institute (China)
Tongsheng Shen, Naval Aeronautical Engineering Institute (China)
Yanli Han, Naval Aeronautical Engineering Institute (China)


Published in SPIE Proceedings Vol. 5640:
Infrared Components and Their Applications
Haimei Gong; Yi Cai; Jean-Pierre Chatard, Editor(s)

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