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Proceedings Paper

Method to enhance the accuracy of the retardance measurement of quarter-wave plates
Author(s): Zheng Ping Wang; Qing Bo Li; Qiao Tan; Zong Jun Huang; Jin Hui Shi
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Paper Abstract

A novel method used for the enhancement of the accuracy of the measurement of the retardance of a quarter-wave plate employing two polaroids and a prism is reported under the condition of knowing the direction of the fast axis of the plate. The theoretical analysis of the principle and the uncertainty formula are given. An application example is also demonstrated. The measured result of the example is verified with an experiment. The main advantages of this method include the accuracy enhancement, simple measuring setup and easy operation.

Paper Details

Date Published: 10 February 2005
PDF: 8 pages
Proc. SPIE 5638, Optical Design and Testing II, (10 February 2005); doi: 10.1117/12.573732
Show Author Affiliations
Zheng Ping Wang, Harbin Engineering Univ. (China)
Qing Bo Li, Harbin Engineering Univ. (China)
Qiao Tan, Harbin Engineering Univ. (China)
Zong Jun Huang, Harbin Engineering Univ. (China)
Jin Hui Shi, Harbin Engineering Univ. (China)


Published in SPIE Proceedings Vol. 5638:
Optical Design and Testing II
Yongtian Wang; Zhicheng Weng; Shenghua Ye; Jose M. Sasian, Editor(s)

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