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Proceedings Paper

An automatic inspection of SMT rectangular chips based on PCA algorithm
Author(s): Kyung Cheol Koh; Kuk Won Ko; Byoung-Wook Choi; Jong Hyeong Kim; Hyung Suck Cho
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Paper Abstract

In this paper, we present a practical approach to automatic visual inspection of SMT PCBs. There are thousands of chip components mounted on the notebook SMT PCB. The images of those chip components could not be exactly same due to the variance of shift, orientation, scale, and illumination condition. Even so, we could not memorize all kinds of inspection reference values for the different conditions. Most of inspection algorithms with fixed window template such as template matching, Fourier analysis, OCR, etc., do not show good performance for images with shifted, oriented, scaled, and variable illumination conditions. We propose a practical automatic inspection method of SMT rectangular chips; correcting the image variance of shift, orientation, and scale with practical speed, and updating the decision reference values in the inspection process. The performance of the proposed method is tested on numerous samples of rectangular chips on SMT PCB.

Paper Details

Date Published: 25 October 2004
PDF: 7 pages
Proc. SPIE 5603, Machine Vision and its Optomechatronic Applications, (25 October 2004); doi: 10.1117/12.573592
Show Author Affiliations
Kyung Cheol Koh, Sunmoon Univ. (South Korea)
Kuk Won Ko, Sunmoon Univ. (South Korea)
Byoung-Wook Choi, Sunmoon Univ. (South Korea)
Jong Hyeong Kim, Seoul National Univ. of Technology (South Korea)
Hyung Suck Cho, Korea Advanced Institute of Science and Technology (South Korea)

Published in SPIE Proceedings Vol. 5603:
Machine Vision and its Optomechatronic Applications
Shun'ichi Kaneko; Hyungsuck Cho; George K. Knopf; Rainer Tutsch, Editor(s)

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