Share Email Print

Proceedings Paper

Error analysis for the far-field of diode lasers
Author(s): Changqing Ch. Cao; Xiaodong Zeng; Yuying An
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Based on the off-axis theory, a further study of error analysis for the far field radiated from a small planar source is made and "sensitivity" and "sensitivity region" are discussed. Numerical results are also given to examine "sensitivity" and "sensitivity region" to the position of aberration tolerance. It is shown that "sensitivity region" is an important parameter to analyze and describe the far-field errors.

Paper Details

Date Published: 20 January 2005
PDF: 8 pages
Proc. SPIE 5628, Semiconductor Lasers and Applications II, (20 January 2005); doi: 10.1117/12.573289
Show Author Affiliations
Changqing Ch. Cao, Xidian Univ. (China)
Xiaodong Zeng, Xidian Univ. (China)
Yuying An, Xidian Univ. (China)

Published in SPIE Proceedings Vol. 5628:
Semiconductor Lasers and Applications II
Jian-quan Yao; Yung Jui Chen; Seok Lee, Editor(s)

© SPIE. Terms of Use
Back to Top