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Proceedings Paper

Optical spectroscopy of silicon-on-insulator waveguide photonic crystals
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Paper Abstract

Photonic modes in 1-D and 2-D silicon-on-insulator photonic crystal waveguides periodic or containing line-defects, are fully explored by means of angle- and polarization-resolved micro-reflectance measurements. Both quasi-guided and truly guided photonic modes are probed with a frequency-wave vector range that is greatly expanded under attenuated total reflectance configuration. It is shown that the presence of a supercell repetition in the direction perpendicular to a line defect leads to the simultaneous excitation of defect and bulk modes folded in a reduced Brillouin zone. Consequently, the group-velocity dispersion of the defect modes corresponding to different polarizations of light can be fully determined. We show also that the measured dispersion is in good agreement with full 3D calculations based on expansion in the waveguide modes.

Paper Details

Date Published: 9 February 2005
PDF: 13 pages
Proc. SPIE 5635, Nanophotonics, Nanostructure, and Nanometrology, (9 February 2005); doi: 10.1117/12.572867
Show Author Affiliations
Michele Belotti, Ctr. National de la Recherche Scientifique (France)
INFM and Univ. degli Studi di Pavia (Italy)
Matteo Galli, Univ. degli Studi di Pavia (Italy)
Daniele Bajoni, Univ. degli Studi di Pavia (Italy)
Giorgio Guizzetti, Univ. degli Studi di Pavia (Italy)
Dario Gerace, Univ. degli Studi di Pavia (Italy)
Mario Agio, Univ. degli Studi di Pavia (Italy)
Lucio Claudio Andreani, Univ. degli Studi di Pavia (Italy)
Philippe Lalanne, CNRS and Univ. Paris-Sud (France)
Yong Chen, Ecole Normale Superieure (France)
Lab. de Photonique et Nanostructures (France)

Published in SPIE Proceedings Vol. 5635:
Nanophotonics, Nanostructure, and Nanometrology
Xing Zhu; Stephen Y. Chou; Yasuhiko Arakawa, Editor(s)

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